Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting. (18th August 2020)

Record Type:
Book
Title:
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting. (18th August 2020)
Main Title:
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2020
Extent:
1 online resource (42 pages)
Subjects:
602.1841
X-ray apparatus
X-ray analysis
Instruments
Density measurement
X-rays
Thickness measurement
Languages:
English
Related ISBNs:
9780539016529
ISSNs:
3038-0296
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.546807
Ingest File:
03_160.xml