Semiconductor devices. Micro-electromechanical devices. Performance testing method of vibration-driven MEMS electret energy harvesting devices Part 28, (22nd July 2020)

Record Type:
Book
Title:
Semiconductor devices. Micro-electromechanical devices. Performance testing method of vibration-driven MEMS electret energy harvesting devices Part 28, (22nd July 2020)
Main Title:
Semiconductor devices. Micro-electromechanical devices.
Authors:
British Standards Institution,
Issue Display:
Part 28
Part:
28
Issue Sort Value:
0000-0000-0000-0028
Publisher Details:
London : British Standards Institution
Publication Date:
2020
Extent:
1 online resource (20 pages)
Subjects:
602.1841
Test equipment
Test specimens
Vibration
Resonance
Bend testing
Fatigue testing
Thin-film devices
Integrating circuits
Semiconductor technology
Electromechanical devices
Electronic equipment and components
Semiconductor devices
Languages:
English
Related ISBNs:
9780580901980
ISSNs:
3032-3631
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.546319
Ingest File:
03_160.xml