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MLA Citation
Tapan (Tapan K.) Sarkar et al.. Modern characterization of electromagnetic systems and its associated metrology. Hoboken : John Wiley & Sons, Inc, 2020. http://access.bl.uk/ark:/81055/vdc_100131156425.0x000001
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Tapan (Tapan K.) Sarkar et al.. Modern characterization of electromagnetic systems and its associated metrology. Hoboken : John Wiley & Sons, Inc, 2020. http://access.bl.uk/ark:/81055/vdc_100131156425.0x000001