BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA). (12th December 2019)

Record Type:: Book
Title:: BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA). (12th December 2019)
Main Title:: BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2019
Extent:: 1 online resource (20 pages)
Subjects:: 602.1841
Semiconductor diodes
Detectors
Semiconductors
X-ray fluorescence spectrometry
Spectroscopy
Electron beams
Chemical analysis and testing
Languages:: English
ISSNs:: 3039-4914
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.542276
Ingest File:: 03_152.xml