BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS. (29th October 2019)

Record Type:
Book
Title:
BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS. (29th October 2019)
Main Title:
BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2019
Extent:
1 online resource (25 pages)
Subjects:
602.1841
Surfaces
Surface chemistry
Optical measurement
Chemical composition
Glow discharges
Quantitative analysis
Spectroscopy
Chemical analysis and testing
Thickness
Mass
Languages:
English
ISSNs:
3039-9949
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.541484
Ingest File:
03_149.xml