BS EN IEC 60749-41. Semiconductor devices. Mechanical and climatic test methods. Part 41. Standard reliability testing methods of non-volatile memory devices (29th August 2019)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 2019
• Extent: 1 online resource (21 pages)
• Subjects: 602.1841; Integrated circuits; Solderability testing; Strength of materials; Dimensional measurement; Classification systems; Specimen preparation; Accelerated testing; Pull-out tests; Mass spectrometry; Mechanical testing; Thermal-shock tests; Storage; Electrical testing; Visual inspection (testing); Torsion testing; Low-pressure tests; Defects; Endurance testing; Test equipment; Test specimens; Electric terminals; Temperature measurement; Environmental testing; Marking; Shear testing; Leak tests; Electronic equipment and components; Bonding; Stress; Moisture measurement; Vibration testing; Radioactive tracer methods; Thermal testing; Semiconductor devices; Fire tests; Damp-heat tests; Flammability; Testing conditions
• Languages: English
• ISSNs: 3035-0992
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.