Microscopy of semiconducting materials 1987, proceedings of the Institute of Physics Conference, Oxford University, April 1987. (2020)
- Record Type:
- Book
- Title:
- Microscopy of semiconducting materials 1987, proceedings of the Institute of Physics Conference, Oxford University, April 1987. (2020)
- Main Title:
- Microscopy of semiconducting materials 1987, proceedings of the Institute of Physics Conference, Oxford University, April 1987
- Further Information:
- Note: Edited by A.G. Cullis and P.D. Augustus.
- Authors:
- Cullis, A. G
- Editors:
- Cullis, A. G
Augustus, P. D - Other Names:
- Institute of Physics (Great Britain)
- Contents:
- High resolution microscopy (9 papers). Epitaxial layers (21 papers). Quantum wells and superlattices (11 papers). Properties of dislocations (5 papers). Device silicon and dielectric structures (24 papers). Silicides and contacts (5 papers). Device testing (6 papers). X-ray techniques (5 papers). Microanalysis (6 papers). Advanced scanning microscopy techniques (17 papers). Bulk gallium arsenide and other compounds (15 papers). Author index. Subject index.
- Edition:
- 1st
- Publisher Details:
- Boca Raton : CRC Press
- Publication Date:
- 2020
- Extent:
- 1 online resource
- Subjects:
- 537.622
Semiconductors -- Congresses
Electron microscopy -- Congresses - Languages:
- English
- ISBNs:
- 9781000157017
- Related ISBNs:
- 9781000112207
9781000132168
9781003069621 - Notes:
- Note: Description based on CIP data; resource not viewed.
- Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.578914
- Ingest File:
- 03_220.xml