Microscopy of semiconducting materials 1983, third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983. (2020)

• Record Type: Book
• Further Information: Note: Edited by A.G. Cullis, S.M. Davidson and G.R. Booker.
• Authors: Cullis, A. G
• Editors: Cullis, A. G; Davidson, S. M; Booker, G. R
• Other Names: Conference on Microscopy of Semiconducting Materials, 3rd
• Contents: Section 1 Structure and properties of dislocations, Section 2 High resolution microscopy, Section 3 Transient annealing phenomena, Section 4 Silicon characterisation, Section 5 Compund semiconductor characterization, Section 6 Scanning EBIC and CL, Section 7 X-ray techniques, Section 8 Non-conventional microscopy, Section 9 Device assement by scanning microscopy, Section 10 Device assessment by transmisison microscopy.
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2020
• Extent: 1 online resource
• Subjects: 537.622; Semiconductors -- Congresses; Electron microscopy -- Congresses
• Languages: English
• ISBNs: 9781000156973
• Related ISBNs: 9781000112160; 9781000132120; 9781003069614
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.