Harmonized system of quality assessment for electronic components. Semiconductor devices. Generic specification Part 0, (31st May 1985)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 1985
• Extent: 1 online resource (28 pages)
• Subjects: 602.1841; Testing conditions; Statistical quality control; Sampling methods; Assessed quality; Endurance testing; Quality control; Orientation; Semiconductor devices; Inspection; Qualification approval; Performance testing; Quality assurance systems; Integrated circuits; Mechanical testing; Marking; Specification (approval); Approval testing; Electronic equipment and components
• Languages: English
• Related ISBNs: 058014495X
• ISSNs: 1014-5754
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.