Semiconductor devices. Mechanical and climatic test methods Part 3, (31st January 1986)
- Record Type:
- Book
- Title:
- Semiconductor devices. Mechanical and climatic test methods Part 3, (31st January 1986)
- Main Title:
- Semiconductor devices.
- Authors:
- British Standards Institution,
- Issue Display:
- Part 3
- Part:
- 3
- Issue Sort Value:
- 0000-0000-0000-0003
- Publisher Details:
- London : British Standards Institution
- Publication Date:
- 1986
- Extent:
- 1 online resource (42 pages)
- Subjects:
- 602.1841
Torsion testing
Testing conditions
Visual inspection (testing)
Defects
Damp-heat tests
Shear testing
Thermal testing
Circuits
Environmental testing
Solderability testing
Electronic equipment and components
Leak tests
Marking
Flammability
Electric terminals
Test equipment
Electric wires
Fire tests
Integrated circuits
Pull-out tests
Endurance testing
Radioactive tracer methods
Semiconductor devices
Mechanical testing
Joints - Languages:
- English
- Related ISBNs:
- 0580148424
- ISSNs:
- 0015-1832
- Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.524861
- Ingest File:
- 03_118.xml