Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices. (30th June 1983)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 1983
• Extent: 1 online resource (100 pages)
• Subjects: 602.1841; Marking; Capacitance measurement; Optoelectronic devices; Couplers; Overvoltage tests; Wavelengths; Endurance testing; Optical measurement; Luminous intensity; Semiconductor devices; Radiometry; Light-emitting diodes; Light-emitting devices; Light distribution; Inspection; Surges (electrical); Electrical testing; Qualification approval; Testing conditions; Phototransistors; Quality assurance systems; Voltage measurement; Sampling methods; Electrical measurement; Solderability testing; Approval testing; Liquid crystal devices; Short-circuit current tests; Designations; Resistance measurement; Luminance; Radiant flux density; Circuits; Infrared radiation; Flashover; Assessed quality; Electronic equipment and components; Specification (approval); Bandwidths; Test equipment; Time measurement; Mechanical testing; Environmental testing; Thermal-cycling tests; Photodiodes; Performance testing; Current measurement; Orientation; Leak tests
• Languages: English
• Related ISBNs: 0580119416
• ISSNs: 0015-0331
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.