Thermal Conductivity Measurements in Atomically Thin Materials and Devices. (2020)

• Record Type: Book
• Further Information: Note: T. Serkan Kasirga.
• Authors: Kasirga, T. Serkan
• Publisher Details: Singapore : Springer
• Publication Date: 2020
• Copyright Date: 2020
• Extent: 1 online resource (50 pages)
• Subjects: Physics; Nanoscale science; Nanoscience; Nanostructures; Optical materials; Electronic materials; Thermodynamics; Heat engineering; Heat transfer; Mass transfer; Surfaces (Physics); Interfaces (Physical sciences); Thin films; Solid state physics; Science -- Mechanics -- Dynamics -- Thermodynamics; Science -- Solid State Physics; Electronic devices & materials; Engineering thermodynamics; Condensed matter physics (liquid state & solid state physics); Spectrum analysis, spectrochemistry, mass spectrometry; Materials science; Science -- Nanostructures; Nanotechnology; Materials--Surfaces
• Languages: English
• ISBNs: 9789811553486
• Related ISBNs: 9789811553479
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.