Electron microscopy and analysis 1997, proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997. (2020)

• Record Type: Book
• Other Titles: Electron microscopy and analysis 1997
• Further Information: Note: Edited by John M. Rodenburg.
• Authors: Rodenburg, John M
• Editors: Rodenburg, J. M (John M.)
• Other Names: Institute of Physics (Great Britain). Electron Microscopy and Analysis Group. Conference (1997) (University of Cambridge) creator.; University of Cambridge, host institution.
• Contents: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2020
• Extent: 1 online resource
• Subjects: 502.825; Electron microscopy -- Congresses
• Languages: English
• ISBNs: 9781000157116
• Related ISBNs: 9781000112306; 9781000132267; 9781003063056
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.