Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies. (2020)
- Record Type:
- Book
- Title:
- Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies. (2020)
- Main Title:
- Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
- Further Information:
- Note: António Manuel Lourenço Canelas, Jorge Manuel Correia Guilherme, Nuno Cavaco Gomes Horta.
- Authors:
- Canelas, António Manuel Lourenço
Guilherme, Jorge Manuel Correia
Horta, Nuno Cavaco Gomes - Contents:
- 1. Introduction2. Analog IC Sizing Background3. Yield Estimation Techniques Related Work4. Monte Carlo-Based Yield Estimation New Methodology5. AIDA-C Variation-Aware Circuit Synthesis Tool6. Tests & Results7. Conclusion and Future WorkIndex.
- Publisher Details:
- Cham : Springer
- Publication Date:
- 2020
- Copyright Date:
- 2020
- Extent:
- 1 online resource (237 pages)
- Subjects:
- Engineering
Electronic circuits
Computer engineering
Internet of things
Embedded computer systems
Electronics
Microelectronics
Technology & Engineering -- Electrical
Technology & Engineering -- Electronics -- General
Electrical engineering
Electronics engineering
Technology & Engineering -- Electronics -- Circuits -- General
Circuits & components - Languages:
- English
- ISBNs:
- 9783030415365
- Related ISBNs:
- 9783030415358
- Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.507436
- Ingest File:
- 03_083.xml