Surface and thin film analysis : a compendium of principles, instrumentation, and applications /: a compendium of principles, instrumentation, and applications. ([2011])

• Record Type: Book
• Further Information: Note: Edited by Gernot Friedbacher and Henning Bubert.
• Other Names: Friedbacher, Gernot; Bubert, H (Henning)
• Contents: Pt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy.
• Edition: Second, completely revised and enlarged ed
• Publisher Details: Weinheim : Wiley-VCH
• Publication Date: 2011
• Extent: 1 online resource
• Subjects: 620/.44; Thin films -- Surfaces -- Analysis; Electron spectroscopy; Spectrum analysis; TECHNOLOGY & ENGINEERING -- Nanotechnology & MEMS; Electron spectroscopy; Spectrum analysis; Dünne Schicht; Oberflächenanalyse; Instrumentelle Analytik; Electronic books
• Languages: English
• ISBNs: 9783527636938; 3527636935
• Notes: Note: Includes bibliographical references and index.; Note: Print version record.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.