Materials characterization : introduction to microscopic and spectroscopic methods /: introduction to microscopic and spectroscopic methods. ([2013])

• Record Type: Book
• Further Information: Note: Yang Leng.
• Authors: Leng, Y (Yang)
• Contents: Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
• Edition: Second edition
• Publisher Details: Weinheim, Germany : Wiley-VCH
• Publication Date: 2013
• Copyright Date: 2013
• Extent: 1 online resource (xiv, 376 pages), illustrations
• Subjects: 620.11; Materials; Materials -- Analysis; TECHNOLOGY & ENGINEERING -- Engineering (General); TECHNOLOGY & ENGINEERING -- Reference; Materials; Materials -- Analysis; Werkstoffprüfung; Mikrostruktur; Mikroskopie; Spektroskopie; Thermoanalyse; Electronic books; Textbooks; Electronic books
• Languages: English
• ISBNs: 9783527670772; 3527670777; 9783527670802; 3527670807; 9783527670796; 3527670793; 9783527670789; 3527670785; 9780470822982; 0470822988
• Related ISBNs: 9783527334636; 3527334637
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (ebrary platform, viewed May 21, 2014).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.