Basic concepts of X-ray diffraction. (2014)

• Record Type: Book
• Further Information: Note: Emil Zolotoyabko.
• Authors: Zolotoyabko, Emil
• Contents: Preface; Introduction; ; DIFFRACTION PHENOMENA IN OPTICS; ; WAVE PROPAGATION IN PERIODIC MEDIA; ; DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS; The Two-Beam Approximation; Diffraction Profile: The Laue Scattering Geometry; Diffraction Profile: The Bragg Scattering Geometry; ; DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH; Dynamical X-Ray Diffraction: Two-Beam Approximation; ; DYNAMICAL DIFFRACTION: THE DARWIN APPROACH; Scattering by a Single Electron; Atomic Scattering Factor; Structure Factor; Scattering Amplitude from an Individual Atomic Plane; Diffraction Intensity inthe Bragg Scattering Geometry; ; DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH; Takagi Equations; Taupin Equation; ; X-RAY ABSORPTION; ; DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS; Direct Wave Summation Method; ; RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES; ; X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION; X-Ray Polarization Factor; Debye-Waller Factor; ; X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS; Ideal Mosaic Crystal; Powder Diffraction; ; APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS; ; APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS; Internal Standard Method; Rietveld Refinement; ; APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS; The March-Dollase Approach; ; APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS; Line Broadening due to Finite Crystallite Size; Line Broadening due to Microstrain Fluctuations; Williamson-Hall Method; The Convolution Approach; Instrumental Broadening; Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles; ; APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS; Strain Measurements in Single-Crystalline Systems; Residual Stress Measurements in Polycrystalline Materials; ; IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION; ; X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION; The Theory of Energy-Variable Diffraction (EVD); ; INELASTIC SCATTERING; Inelastic Neutron Scattering; Inelastic X-Ray Scattering; ; INTERACTION OF X-RAYS WITH ACOUSTIC WAVES; Thermal Diffuse Scattering; Coherent Scattering by Externally Excited Phonons; ; TIME-RESOLVED X-RAY DIFFRACTION; ; X-RAY SOURCES; Synchrotron Radiation; ; X-RAY FOCUSING OPTICS; X-Ray Focusing: Geometrical Optics Approach; X-Ray Focusing: Diffraction Optics Approach; ; X-RAY DIFFRACTOMETERS; High-Resolution Diffractometers; Powder Diffractometers; ; Index
• Publisher Details: Place of publication not identified : Wiley-VCH
• Publication Date: 2014
• Extent: 1 online resource (312 pages)
• Subjects: 548.83; X-rays -- Diffraction
• Languages: English
• ISBNs: 9783527681181
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.