Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /: simulation, material systems and characterization techniques. (2011)

Record Type:
Book
Title:
Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /: simulation, material systems and characterization techniques. (2011)
Main Title:
Mechanical stress on the nanoscale : simulation, material systems and characterization techniques
Further Information:
Note: Edited by Margrit Hanbücken, Pierre Muller, Ralf B. Wehrspohn.
Other Names:
Hanbücken, Margrit
Muller, Pierre, 1950-
Wehrspohn, Ralf B
Contents:
Pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale.
Publisher Details:
Weinheim : Wiley-VCH
Publication Date:
2011
Extent:
1 online resource (380 pages)
Subjects:
621.3/8152
Semiconductors -- Defects
Semiconductors -- Reliability
TECHNOLOGY & ENGINEERING -- Material Science
Semiconductors -- Defects
Semiconductors -- Reliability
Electronic books
Languages:
English
ISBNs:
9783527410668
9783527639564
9783527639540
3527639543
3527639551
9783527639557
9781283379496
Related ISBNs:
352741066X
352763956X
128337949X
Notes:
Note: Includes bibliographical references and index.
Note: Print version record.
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.505663
Ingest File:
03_080.xml