Nanobeam x-ray scattering : probing matter at the nanoscale /: probing matter at the nanoscale. (2013)

• Record Type: Book
• Further Information: Note: Cristian Mocuta, Dina Carbone, Julian Stangl and Virginie Chamard.
• Other Names: Mocuta, Cristian; Chamard, Virginie; Stangl, Julian; Carbone, Dina
• Contents: Related Titles; Title Page; Authors; Copyright; Foreword; Preface; 1 Introduction; 1.1 X-ray Interaction with Matter; 1.2 Diffraction at Different Lengthscales and Real-Space Resolution; 1.3 Future Developments; 2 X-ray Diffraction Principles; 2.1 A Brief Introduction to Diffraction Theory; 2.2 Kinematic X-ray Diffraction Theory; 2.3 Reflectivity; 2.4 Properties of X-ray Beams; 2.5 A Note on Coherence; 2.6 X-ray Sources; 2.7 Diffraction Measurement: How to Access q in a Real Experiment; 3 X-ray Focusing Elements Characterization; 3.1 Introduction and Context 3.2 Refractive X-ray Lenses3.3 X-ray Mirrors. Reflection of X-rays at Surfaces; 3.4 Diffractive X-ray Optics; 3.5 Other X-ray Optics; 3.6 Measuring the Size of the X-ray Focused Spot; 3.7 Conclusion; 4 Scattering Experiments Using Nanobeams; 4.1 From the Ensemble Average Approach towards the Single Nanostructure Study; 4.2 Scanning X-ray Diffraction Microscopy; 4.3 Finite Element Based Analysis of Diffraction Data; 4.4 Single Structure Inside a Device; 4.5 Examples from Biology; 4.6 Recent Experiments: The Current Limits; 4.7 Outlook; 5 Nanobeam Diffraction Setups; 5.1 Introduction 5.2 Typical X-ray Diffraction Setup5.3 Nanodiffraction Setup Requirements; 5.4 Nanobeam and Coherence Setup; 5.5 Detectors: Pixel and Time Resolution, Dynamical Range; 5.6 Some Intrinsic Issues; 5.7 Sample Environment: Specific Solutions for Nanobeams?; 6 Spectroscopic Techniques Using Focused Beams; 6.1 Introduction and Context; 6.2 Scanning X-ray Microscopy with Various Contrasts; 6.3 Soft X-rays Used for Imaging with Magnetic Contrast; 7 Coherent Diffraction: From Phase Sensitivity to Phase Retrieval; 7.1 Matter in the Light of Coherent X-rays 7.2 Exploiting the Phase Sensitivity: Statistical Investigation of Defects in Matter7.3 Encoding the Phase Directly: The Holographic Approach; 7.4 Support-based Phase Retrieval Coherent Diffraction Imaging; 7.5 Fresnel Coherent Diffraction Imaging; 7.6 Ptychography; 8 Lensless Microscopy Imaging: Context and Limits; 8.1 Resolution and Sensitivity; 8.2 Experimental Design; 8.3 How to Model: Defining the Physics Scheme; 8.4 Phase Retrieval Strategies; 9 Future Developments; 9.1 Nanobeams: Hopes and Doubts; 9.2 Beamlines at Third-generation Synchrotron Sources 9.3 The Role of Free Electron Lasers9.4 Conclusion; Abbreviation list; References; Index
• Publisher Details: Place of publication not identified : Wiley-VCH
• Publication Date: 2013
• Extent: 1 online resource
• Subjects: 539.7222; Technology; TECHNOLOGY & ENGINEERING -- Materials Science; Technology; Electronic books
• Languages: English
• ISBNs: 9783527655083; 3527655085
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.