Advances in Imaging and Electron Physics. (2020)

• Record Type: Book
• Further Information: Note: Martin Hytch, Peter W. Hawkes.
• Editors: Hÿtch, Martin; Hawkes, Peter W
• Contents: Part 1: Quantum degeneracy 1. Partially coherent quantum degenerate electron matter waves Sam Keramati, Eric Jones, Jeremy Armstrong, Herman Batelaan Part 2: The contribution of atom probe tomography to the correlation of the optical and structural properties of semiconductor nanostructures 2. Laser-assisted atom probe tomography Lorenzo Rigutti 3. Inaccuracies in atom probe measurements of semiconductor composition Lorenzo Rigutti 4. Atom probe-based correlative microscopy Lorenzo Rigutti 5. In-situ optical spectroscopy within an atom probe Lorenzo Rigutti Part 3: CPO Proceedings Papers 6. Derivation, Cross-Validation, and Comparison of Analytic Formulas for Electrostatic Deflector Aberrations Eremey Valetov, Martin Berz 7. Analysis and Fringe Field Scaling of a Legacy Set of Electrostatic Deflector Aberration Formulas Eremey Valetov Part 4: Advances in Optical Electron Microscopy 8. Scanning Optical Microscopy C. J. R. Sheppard
• Publisher Details: Academic Press
• Publication Date: 2020
• Extent: 1 online resource (344 pages)
• Languages: English
• ISBNs: 9780128209981; 0128209984
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.