Atomic force microscopy. (2019)

• Record Type: Book
• Further Information: Note: Bert Voigtländer.
• Authors: Voigtländer, Bert
• Contents: Introduction.- Part I: Scanning Probe Microscopy Instrumentation.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe.- Part II: Atomic Force Microscopy (AFM).- Forces between Tip and Sample.- Technical Aspects of Atomic Force Microscopy.- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance.- Frequency Modulation (FM) Mode in Dynamic Atomic Force.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic Force Microscopy.
• Edition: Second edition
• Publisher Details: Cham, Switzerland : Springer
• Publication Date: 2019
• Extent: 1 online resource
• Subjects: 620/.5; Atomic force microscopy; TECHNOLOGY & ENGINEERING / Engineering (General); TECHNOLOGY & ENGINEERING / Reference; Electronic books; Electronic books
• Languages: English
• ISBNs: 9783030136543
• Related ISBNs: 303013654X; 9783030136536
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (Ebsco, viewed May 29, 2019).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.