Compendium of surface and interface analysis. ([2018])

• Record Type: Book
• Further Information: Note: The Surface Science Society of Japan, editor.
• Editors: Surface Science Society of Japan,
• Contents: Intro; List of the Editorial Staff; Editor-in-Chief; Vice Editor-in-Chief; Associate Editors; Preface; Contents; 1 Acoustic Microscopy; 1.1 Principles; 1.1.1 Observation of Soft Biological Matters; 1.1.2 Observation of Solid Matters; 1.2 Features; 1.3 Applications; 1.3.1 Sound Speed Profile; 1.3.2 Acoustic Impedance Profiles; Appendix; Derivation of Eq. Â (1.1); Derivation of Eq. Â (1.2); Derivation of Eq. Â (1.3); References; 2 Action Spectroscopy with STM; 2.1 Principle; 2.2 Features; 2.3 Instrumentation; 2.4 Applications; 2.4.1 Fundamental Structure of an Isolated Water Dimer on Pt(111). 2.4.2 Dissociation Pathways of a Single Dimethyl Disulfide on Cu(111)References; 3 Ambient Pressure X-Ray Photoelectron Spectroscopy; 3.1 Principle; 3.2 Features; 3.3 Instrumentation; 3.4 Applications; 3.4.1 Operando Observation of Chemical Reaction; References; 4 Angle-Resolved Ultraviolet Photoelectron Spectroscopy; 4.1 Principle; 4.2 Features; 4.3 Instrumentation; 4.4 Applications; 4.4.1 Band Dispersion and Fermi Surface of 1T-VSe2; References; 5 Atom Probe Field Ion Microscope; 5.1 Principle; 5.2 Features; 5.3 Instrumentation; 5.4 Applications; 5.4.1 FIM Observation of a W Tip. 5.4.2 AP Analysis: Alloy of Ptâ#x80;#x93;Ir5.4.3 AP Analysis: The Interface Between Al and GaAs; References; 6 Atomic Force Microscope; 6.1 Principle; 6.2 Features; 6.3 Instrumentation; 6.4 Applications; 6.4.1 Atomic Resolution Imaging of an Insulating Surface in Contact Mode; 6.4.2 Force Measurement of a Single-Molecule Junction; References; 7 Auger Electron Spectroscopy; 7.1 Principle; 7.2 Features; 7.3 Instrumentation; 7.4 Applications; References; 8 Cathodoluminescence; 8.1 Principle; 8.2 Features; 8.3 Instrumentation; 8.4 Applications; References; 9 Conductive Atomic Force Microscopy. 9.1 Principle9.2 Features; 9.3 Instrumentation; 9.4 Applications; 9.4.1 Observation of Carbon Resistor; 9.4.2 Observation of P3HT/PCBM Blended Film; Reference; 10 Differential Interference Contrast Microscopy/Phase-Contrast Microscopy; 10.1 Principle; 10.2 Features; 10.3 Instrumentation; 10.3.1 DIM; 10.3.2 PCM; 10.4 Applications; 10.4.1 Spiral Growth Steps on a Silicon Carbide (SiC) Crystal; 10.4.2 Single Molecular Step on Ice; References; 11 Dynamic Secondary Ion Mass Spectrometry; 11.1 Principles; 11.2 Features; 11.3 Instrumentation; 11.4 Applications; References. 12 Elastic Recoil Detection Analysis12.1 Principle; 12.2 Features; 12.3 Instrumentation; 12.3.1 ERDA with Stopper Foil; 12.3.2 â#x88;#x86;E-E Telescope ERDA; 12.3.3 TOF-E Telescope ERDA; 12.4 Applications; 12.4.1 Hydrogen and Deuteron (Heavy Hydrogen) Quantification on a-C:H Films; 12.4.2 â#x88;#x86;E-E Plot Taken on TaO2N Film; References; 13 Electrochemical Atomic Force Microscopy; 13.1 Principle; 13.2 Features; 13.3 Instrumentation; 13.4 Application; 13.4.1 EC-FM-AFM Utilizing Iodine-Modified Au(111) Surface [9]; References; 14 Electrochemical Infrared Spectroscopy; 14.1 Principle; 14.2 Features.
• Publisher Details: Singapore : Springer
• Publication Date: 2018
• Copyright Date: 2018
• Extent: 1 online resource
• Subjects: 620.44; Surfaces (Technology) -- Analysis; Surfaces (Physics); Surface chemistry; Interfaces (Physical sciences); TECHNOLOGY & ENGINEERING -- Engineering (General); TECHNOLOGY & ENGINEERING -- Reference; Interfaces (Physical sciences); Surface chemistry; Surfaces (Physics); Surfaces (Technology) -- Analysis; Electronic books
• Languages: English
• ISBNs: 9789811061561; 9811061564
• Related ISBNs: 9789811061554
• Notes: Note: Includes bibliographical references.; Note: Online resource; title from PDF title page (EBSCO, viewed February 23, 2018).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.