Magnetic microscopy of layered structures. ([2014])

• Record Type: Book
• Further Information: Note: Wolfgang Kuch, Rudolf Schäfer, Peter Fischer, Franz Ulrich Hillebrecht.
• Authors: Kuch, Wolfgang; Schäfer, Rudolf; Fischer, Peter; Hillebrecht, Franz Ulrich
• Contents: Preface; Acknowledgments; Contents; 1 Introduction; 1.1 Layered Magnetic Structures; 1.1.1 Magnetoresistive Devices; 1.1.2 Spintronics; 1.1.3 Ferromagnetic -- Antiferromagnetic Heterostructures; 1.1.4 Need for Layer-Resolved Information; 1.1.5 Need for Time Resolution; 1.2 Approaches to Layer-Resolved Magnetic Imaging; 1.2.1 Interference-Based Approach; 1.2.2 Electronic Properties-Based Approach; 2 Magneto-Optical Effects; 2.1 Overview; 2.2 Optical Basics of Conventional Effects; 2.2.1 Wave Equation; 2.2.2 Polarized Light; 2.2.3 Birefringence, Dichroism, and Optical Activity. 2.2.4 The Compensator2.2.5 Reflection and Transmission of Polarized Light; 2.3 Electromagnetic Basics of Conventional Effects ; 2.3.1 The Dielectric Permittivity Tensor; 2.3.2 Solutions; 2.4 Faraday and Kerr Effect ; 2.4.1 Phenomenological Description; 2.4.2 Geometry of the Rotation Effects; 2.4.3 Kerr Contrast and Signal; 2.4.4 Microscopic Origin of the Kerr Effect; 2.5 Voigt Effect; 2.6 Gradient Effect; 2.7 X-Ray Magnetic Dichroism; 2.7.1 X-Ray Magnetic Linear Dichroism; 2.7.2 Circularly Polarized X-rays; 2.7.3 X-Ray Magnetic Circular Dichroism. 3 Depth-Sensitive Conventional Magneto-Optical Microscopy3.1 Magneto-Optical Microscopy and Magnetometry; 3.1.1 Wide-Field Microscopy; 3.1.2 Laser-Scanning Microscopy; 3.1.3 Magneto-Optical Magnetometry and Ellipsometry; 3.2 Depth Sensitivity of Conventional Magneto-Optics; 3.2.1 Experimental Proof of Depth Sensitivity; 3.2.2 Theoretical Approaches to Depth Sensitivity in Magneto-Optics; 3.2.3 Depth Sensitivity Function; 3.2.4 Depth Sensitivity in Magnetic Films; 3.2.5 Depth Sensitivity in Magnetic Multilayers; 3.2.6 Depth Selectivity in Magnetic Multilayers. 3.3 Depth-Selective Kerr Microscopy3.4 Voigt- and Gradient Microscopy; 4 Depth-Sensitive Photoelectron Emission Microscopy; 4.1 Photoelectron Emission Microscopy; 4.2 Electron Yield Detection of Absorption from Buried Layers; 4.3 Imaging Ferromagnetic Materials by X-ray Magnetic Circular Dichroism; 4.3.1 NiFe/Cu/Co Trilayers; 4.3.2 Co/Cu/Ni Trilayers; 4.3.3 NiFe/Al2O3/Co Trilayers; 4.3.4 Ni/Fe/Co Trilayers; 4.3.5 Ni/FeMn/Co Trilayers; 4.4 Imaging Antiferromagnetic Materials by X-ray Magnetic Linear Dichroism. 4.4.1 Magnetic Linear Dichroism as Contrast Mechanism for Layer-Resolved Magnetic Imaging Using PEEM4.4.2 Exchange Coupling at the Interface of NiO and a Ferromagnetic Metal; 4.4.3 CoO/NiO Heterostructures; 4.4.4 Co/LaFeO3 Heterostructures; 4.5 Time- and Layer-Resolved Magnetic Imaging by XMCD-PEEM; 5 Magnetic Transmission Soft X-Ray Microscopy; 5.1 Introduction; 5.2 Absorption of X Rays in Transmission Experiments ; 5.3 Basic Elements in Magnetic Transmission Soft X-Ray Microscopy ; 5.3.1 Fresnel Zone Plates as Optical Elements ; 5.3.2 Experimental Set-Up; 5.3.3 Sample Properties.
• Publisher Details: Heidelberg : Springer
• Publication Date: 2014
• Copyright Date: 2015
• Extent: 1 online resource (xi, 246 pages), illustrations (some color)
• Subjects: 578.4; Microscopy -- Technique; NATURE -- Animals -- Wildlife; SCIENCE -- Microscopes & Microscopy; Microscopy -- Technique; Electronic books
• Languages: English
• ISBNs: 9783662445327; 3662445328; 9783662445310
• Related ISBNs: 366244531X; 9783662445310
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (SpringerLink, viewed December 17, 2014).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.