Field emission scanning electron microscopy : new perspectives for materials characterization /: new perspectives for materials characterization. ([2018])
- Record Type:
- Book
- Title:
- Field emission scanning electron microscopy : new perspectives for materials characterization /: new perspectives for materials characterization. ([2018])
- Main Title:
- Field emission scanning electron microscopy : new perspectives for materials characterization
- Further Information:
- Note: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
- Authors:
- Brodusch, Nicolas
Demers, Hendrix
Gauvin, Raynald - Contents:
- 1. Introduction 2. Developments in field emission gun technologies and advanced detection systems 3. Advanced specimen preparation a. Surface preparation b. Surface cleaning c. Charging compensation with ionic liquid treatment 4. Electron detection strategies for high resolution imaging: Deceleration and energy filtration a. Principles b. Application of dual in-lens electron detection c. Energy filtration 5. Low voltage SEM a. Strategy of characterization: deceleration and energy filtration b. High resolution imaging c. Low voltage, specimen charging and material contrast d. Ultra-low voltage SEM: uses and limitations 6. Low voltage STEM in the SEM 7. X-ray imaging a. X-ray imaging with a large solid angle annular silicon drift detector b. Material science applications: Mapping at high resolution with high signal-to-noise ratio c. The f-ratio method for quantitative x-ray analysis 8. Electron diffraction techniques in the SEM<a. Electron Channeling Contrast Imaging b. Low voltage STEM defects Imaging c. Electron Backscatter Diffraction d. Dark-Field Electron Backscatter Diffraction e. Transmission Forward Electron Backscatter Diffraction f. Dark-Field Imaging with a Forecaster Detector in Transmission Mode 9. Magnetic domain imaging 10. General conclusion and perspectives.
- Publisher Details:
- Singapore : Springer
- Publication Date:
- 2018
- Extent:
- 1 online resource
- Subjects:
- 502.8/25
Scanning electron microscopy
Materials -- Testing
SCIENCE -- General
SCIENCE -- Electron Microscopes & Microscopy
Materials -- Testing
Scanning electron microscopy
Electronic books
Electronic book - Languages:
- English
- ISBNs:
- 9789811044335
9811044333
9811044325
9789811044328 - Related ISBNs:
- 9789811044328
- Notes:
- Note: Includes bibliographical references.
Note: Online resource; title from PDF title page (SpringerLink, viewed October 6, 2017). - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.396360
- Ingest File:
- 02_418.xml