Cite
HARVARD Citation
Servín, M. et al. (2014) Fringe pattern analysis for optical metrology : theory, algorithms, and applications. [Online]. Weinheim : Wiley-VCH. Available from: http://access.bl.uk/ark:/81055/vdc_100074069478.0x000001
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Servín, M. et al. (2014) Fringe pattern analysis for optical metrology : theory, algorithms, and applications. [Online]. Weinheim : Wiley-VCH. Available from: http://access.bl.uk/ark:/81055/vdc_100074069478.0x000001