Surfaces and interfaces of electronic materials. (2012)

• Record Type: Book
• Further Information: Note: By Leonard J. Brillson.
• Other Names: Brillson, L. J
• Contents: Preface; 1. Introduction; 2. Historical Background; 3. Electrical Measurements; 4. Interface states; 5. Ultrahigh vacuum technology; 6. Surface and interface analysis; 7. Photoemission spectroscopy; 8. Photoemission with soft X-rays; 9. Particle-solid scattering; 10. Electron energy loss spectroscopy; 11. Rutherford backscattering spectrometry; 12. Secondary ion mass spectrometry; 13. Electron diffraction; 14. Scanning tunneling microscopy; 15. Optical spectroscopies; 16. Cathodoluminescence spectroscopy; 17. Electronic Materials' Surfaces; 18. Adsorbates on Electronic Materials' Surfaces; 19. Adsorbate-Semiconductor Sensors; 20. Heterojunctions; 21. Metals on semiconductors; 22. The future of interfaces; Appendices
• Publisher Details: Place of publication not identified : Wiley-VCH
• Publication Date: 2012
• Extent: 1 online resource (586 pages)
• Subjects: 621.381; Electronics -- Materials; Surfaces (Technology)
• Languages: English
• ISBNs: 9783527665723
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.