Dielectric breakdown in gigascale electronics : time dependent failure mechanisms /: time dependent failure mechanisms. (2016)

• Record Type: Book
• Further Information: Note: Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky.
• Authors: Borja, Juan Pablo; Lu, Toh-Ming; Plawsky, Joel
• Contents: Introduction -- General Theories -- Measurement Tools and Test Structures -- Experimental Techniques -- Breakdown Experiments -- Kinetics of Charge Carrier Confinement in Thin Dielectrics -- Theory of Dielectric Breakdown in Nanoporous Thin Films -- Dielectric Breakdown in Copper Interconnects -- Reconsidering Conventional Models.
• Publisher Details: Cham, Switzerland : Springer
• Publication Date: 2016
• Extent: 1 online resource
• Subjects: 621.381; Materials science; Microelectronics -- Materials; Interfaces (Physical sciences); TECHNOLOGY & ENGINEERING -- Mechanical; Interfaces (Physical sciences); Microelectronics -- Materials; Materials Science; Optical and Electronic Materials; Nanotechnology and Microengineering; Electronic Circuits and Devices; Nanotechnology; Technology & Engineering -- Nanotechnology & MEMS; Technology & Engineering -- Electronics -- Circuits -- General; Precision instruments manufacture; Circuits & components; Nanotechnology; Optical materials; Engineering; Nanotechnology; Technology & Engineering -- Material Science; Electronic devices & materials; Electronic books
• Languages: English
• ISBNs: 9783319432205; 3319432206
• Related ISBNs: 3319432184; 9783319432182
• Notes: Note: Includes bibliographical references and index.; Note: Online resource, title from PDF title page (EBSCO, viewed September 25, 2016).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.