Testing complex and embedded systems. (2018)
- Record Type:
- Book
- Title:
- Testing complex and embedded systems. (2018)
- Main Title:
- Testing complex and embedded systems
- Further Information:
- Note: By Kim H. Pries, Jon M. Quigley.
- Other Names:
- Pries, Kim H, 1955-
Quigley, Jon M - Contents:
- Does Your Testing Look Like This?; Last-Minute Flailing; Fiascos Uncovered Weeks before Launch; Huge Warranty Problems; Customer Dissatisfaction; ; Benefits of Improved Testing; Product Problems Revealed Early; Improved Reliability = Lower Cost; Happy Customers; Confidence in a Fine Product; Cost-Effective Testing Solutions Not Waiting Until; the Last Minute; Overview; Goals of Testing; Types of Testing; Levels of Testing; ; Basic Principles; Looking at the Evidence; ; The Question; Not Phrases; Instead; ; Contradictory Perspectives of Testing; Organic/Inorganic; Quantitative/Qualitative; Objective/Subjective; Deterministic/Probabilistic; Variable/Attribute; Continuous/Discrete; Wide-Ranging/Focused; Many/Few; Structure/Unstructured; Ordered/Random; Nominal/Overstress; Single Environment/Multiple Environments; Compliance/Characterization; High-Level/Detailed; Growing/Imposing; Bench/Field; Abstraction/Verisimilitude; Reproducible/Nonreproducible; Repeatable/Nonrepeatable; Linear/Nonlinear; Fine/Coarse; Combinatorial/Exhaustive/Stochastic; Focused/Fuzzy; Instant/Enduring; Inside System/Outside System; Ambiguity/Clarity; Sensitive/Insensitive; Long-Range/Short-Range; Costly/Cheap; Flexible/Inflexible; Parameter/Tolerance; Standard/Failure; "Good"/"Bad" Testing; Parallel/Sequential; Fractal/Smooth/Ordered; ; The Use of Noise; Realistic; Can Use Taguchi Approach; Sometimes Difficult to Simulate; Where to Apply Noise?; Exogenous Shocks; Self-Generated Noise; ; How to PerformDoes Your Testing Look Like This?; Last-Minute Flailing; Fiascos Uncovered Weeks before Launch; Huge Warranty Problems; Customer Dissatisfaction; ; Benefits of Improved Testing; Product Problems Revealed Early; Improved Reliability = Lower Cost; Happy Customers; Confidence in a Fine Product; Cost-Effective Testing Solutions Not Waiting Until; the Last Minute; Overview; Goals of Testing; Types of Testing; Levels of Testing; ; Basic Principles; Looking at the Evidence; ; The Question; Not Phrases; Instead; ; Contradictory Perspectives of Testing; Organic/Inorganic; Quantitative/Qualitative; Objective/Subjective; Deterministic/Probabilistic; Variable/Attribute; Continuous/Discrete; Wide-Ranging/Focused; Many/Few; Structure/Unstructured; Ordered/Random; Nominal/Overstress; Single Environment/Multiple Environments; Compliance/Characterization; High-Level/Detailed; Growing/Imposing; Bench/Field; Abstraction/Verisimilitude; Reproducible/Nonreproducible; Repeatable/Nonrepeatable; Linear/Nonlinear; Fine/Coarse; Combinatorial/Exhaustive/Stochastic; Focused/Fuzzy; Instant/Enduring; Inside System/Outside System; Ambiguity/Clarity; Sensitive/Insensitive; Long-Range/Short-Range; Costly/Cheap; Flexible/Inflexible; Parameter/Tolerance; Standard/Failure; "Good"/"Bad" Testing; Parallel/Sequential; Fractal/Smooth/Ordered; ; The Use of Noise; Realistic; Can Use Taguchi Approach; Sometimes Difficult to Simulate; Where to Apply Noise?; Exogenous Shocks; Self-Generated Noise; ; How to Perform "Bad’’ Tests; Do Not; Do; Documenting the Testing; Components of a Test Plan; Components of a Test Report; The DVP&R Format; Failures ; ; Test Administration; Test Management; Test Scheduling; Test Human Resources; Test Device Resources; Test Quality; Test Costing; Test Risk; Calibration Issues; ; Advanced Concepts; Test Impacts; Construct Validity; Types of Bias; Reliability and Confidence; Life Testing; Testing Team Early Involvement; ; Software Test Documentation; IEEE; Defect Life Cycle; ; Configuration Management; Configuration Management Areas; Planning; Elements of Configuration Management; Importance of Configuration Management; Links to Testing; Risks; ; Software Testing; Overview; Software Testing—The Problem; Test Metrics; Software Boundary Testing; Static Code Analysis; Dynamic Code Analysis; ; Systems Testing; End-to-End Testing; Big-Bang Testing; Top-Down Testing; Bottom-Up Testing ; Managing Multiple Test Hardware; and Software Deliveries; Test Configuration Management; System Variations and Test Demands; Functional Testing; System Response to Multiple System Failures; Ranges of System Performance; ; Simulation and Emulation; Simulation; Simulation Levels; Simulation Activities; Objectives of Simulation; Simulation as Verification; Simulation as Test Preparation; Conflict between Simulation and Test Results; ; Span of Tests; Software; Unit Test; Component Test; Subsystem-Level Integration Testing; System; Production Test; Static Analysis; Structural Analysis; Simulation; Prototyping and Simulation; Reliability and Confidence; Limitations of Reliability and Confidence; Concept of "Life" and the Product; Establishing Product Life Exposure; ; Exit Criteria; When Is Enough, Enough?; Compared to Plan?; Testing Ethics; Final Words; ; Bibliography; Index; ; … (more)
- Publisher Details:
- Place of publication not identified : CRC Press
- Publication Date:
- 2018
- Extent:
- 1 online resource (319 pages), (100 illustrations)
- Subjects:
- 004.256
Embedded computer systems -- Testing
Computational complexity - Languages:
- English
- ISBNs:
- 9781351688994
1351688995 - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.372495
- Ingest File:
- 01_358.xml