Contactless VLSI measurement and testing techniques. ([2018])

• Record Type: Book
• Further Information: Note: Selahattin Sayil.
• Authors: Sayil, Selahattin
• Contents: 1. Conventional Test Methods. -- 2. Testability Design -- 3. Other Techniques Based on the Contacting Probe -- 4. Contactless Testing -- 5. Electron-Beam and Photoemission Probing -- 6. Electro Optic Sampling and Charge Density Probe -- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe -- 8. Probing Techniques Based on Light Emission from Chip -- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits -- 10. Comparison of Contactless Testing Methodologies.
• Publisher Details: Cham : Springer
• Publication Date: 2018
• Extent: 1 online resource (92 pages)
• Subjects: 621.39/5; Engineering; Integrated circuits -- Very large scale integration; TECHNOLOGY & ENGINEERING -- Engineering (General); TECHNOLOGY & ENGINEERING -- Reference; TECHNOLOGY & ENGINEERING -- Mechanical; Integrated circuits -- Very large scale integration; Engineering; Circuits and Systems; Processor Architectures; Electronics and Microelectronics, Instrumentation; Computers -- Systems Architecture -- General; Technology & Engineering -- Electronics -- General; Computer architecture & logic design; Electronics engineering; Systems engineering; Computer science; Electronics; Technology & Engineering -- Electronics -- Circuits -- General; Circuits & components; Electronic books
• Languages: English
• ISBNs: 9783319696737; 3319696734
• Related ISBNs: 9783319696720; 3319696726
• Notes: Note: Print version record.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.