Cite
HARVARD Citation
Wang, R. et al. (2017) Testing of interposer-based 2.5D integrated circuits. [Online]. Cham, Switzerland : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100073280335.0x000001
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Wang, R. et al. (2017) Testing of interposer-based 2.5D integrated circuits. [Online]. Cham, Switzerland : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100073280335.0x000001