Cite
HARVARD Citation
Shin, Y. et al. (eds.) (2016) VLSI-SoC : design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised selected papers. [Online]. Switzerland : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100071535920.0x000001