Metrology and physical mechanisms in new generation ionic devices. (2016)

• Record Type: Book
• Further Information: Note: Umberto Celano.
• Authors: Celano, Umberto
• Contents: Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. .
• Publisher Details: Switzerland : Springer
• Publication Date: 2016
• Extent: 1 online resource (xxiv, 175 pages), illustrations (some color)
• Subjects: 621.3815/2; Physics; Thin films; Electronic apparatus and appliances; Metrology; Nonvolatile random-access memory; TECHNOLOGY & ENGINEERING / Mechanical; Electronic apparatus and appliances; Metrology; Nonvolatile random-access memory; Thin films; Technology & Engineering -- Nanotechnology & MEMS; Technology & Engineering -- Material Science; Precision instruments manufacture; Testing of materials; Engineering; Surfaces (Physics); Science -- Spectroscopy & Spectrum Analysis; Spectrum analysis, spectrochemistry, mass spectrometry; Electronic books
• Languages: English
• ISBNs: 9783319395319; 3319395319; 3319395300; 9783319395302
• Related ISBNs: 9783319395302
• Notes: Note: Includes bibliographical references.; Note: Online resource; title from PDF title page (SpringerLink, viewed June 28, 2016).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.