CMOS test and evaluation : a physical perspective /: a physical perspective. ([2015])

• Record Type: Book
• Further Information: Note: Manjul Bhushan, Mark B. Ketchen.
• Other Names: Bhushan, Manjul; Ketchen, Mark B
• Contents: Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
• Publisher Details: New York : Springer
• Publication Date: 2015
• Extent: 1 online resource
• Subjects: 621.381; Engineering; System safety; Electronics; Systems engineering; TECHNOLOGY & ENGINEERING -- Mechanical; Electronics; Engineering; System safety; Systems engineering; Technology & Engineering -- Electronics -- Circuits -- General; Technology & Engineering -- Electronics -- Semiconductors; Technology & Engineering -- Quality Control; Circuits & components; Semi-conductors & super-conductors; Reliability engineering; Technology & Engineering -- Electronics -- General; Electronics engineering; Electronic books
• Languages: English
• ISBNs: 9781493913497; 1493913492; 1493913484; 9781493913480
• Related ISBNs: 9781493913480
• Notes: Note: Vendor-supplied metadata.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.