A Beginners' Guide to Scanning Electron Microscopy. ([2018])

• Record Type: Book
• Further Information: Note: Anwar Ul-Hamid.
• Authors: Ul-Hamid, Anwar
• Contents: Introduction.- What is the SEM.- Image Resolution in the SEM.- Image Formation in the SEM.- Information obtained using the SEM.- Brief History of the SEM Development.- Components of the SEM.- Primary Components.- Electron Column.- Electron Gun.- Thermionic Emission Electron Guns.- Tungsten Filament Guns.- Lanthalum Hexaboride (LaB6) Emitter Guns.- Field Emission Electron Guns.- Electromagnetic Lenses.- Condenser Lenses.- Objective Lenses.- Pinhole Lens.- Immersion Lens.- Snorkel Lens.- Lens Aberrations.- Spherical Aberration.- Chromatic Aberration.- Astigmatism.- Scan Coils.- Objective Aperture.- Specimen Chamber.- Specimen Stage.- CCD Camera.- Detectors.- Secondary Electron Detector (SED).- Backscattered Electron Detector (BSED).- Energy Dispersive X-ray Spectrometer (EDS Detector).- Low Vacuum Detector.- Low Voltage High Contrast Detector.- Through-the-lens Detector.- Electron Backscattered Diffraction (EBSD) Detector.- Scanning Transmission Electron Microscopy (STEM) Detector.- Computer Control System.- Secondary Components.- Vacuum System.- Chiller.- Heater.- Electronics.- Anti-Vibration Platform.- Specialized Equipment.- Focused Ion Beam (FIB) Instrument.- Combined Focused Ion Beam-Scanning Electron Microscope.- Beam-Specimen Interaction.- Atom Model.- Elastic Scattering.- Inelastic Scattering.- Effect of Electron Scattering.- Interaction Volume.- Electron Range.- Signals Obtained From the Specimen.- Backscattered Electrons.- Secondary Electrons.- Characteristic X-Ray Lines.- White Radiation.- X-Ray Fluorescence.- Cathodoluminescence Radiation.- Imaging with the SEM.- Image Formation in the SEM.- Magnification.- Resolution.- Depth of Field.- Contrast.- Secondary Electron Imaging.- Backscattered Electron Imaging.- Influence of Various Factors on SEM Imaging.- Effect of Accelerating Voltage.- Effect of Probe Current.- Effect of Working Distance.- Effect of Objective Aperture.- Effect of Tilt.- Astigmatism.- Image Distortion.- Incorrect Alignment.- Beam Damage.- Charging.- Edge Effect.- Sample direction with respect to the Detector Position.- Factors affecting Image Quality: Indications-Causes-Remedies.- Summary of Specialized Imaging Techniques.- Imaging at Low Vacuum.- Imaging at Low Voltage.- Environmental SEM.- Imaging at Low/Elevated Temperature.- Imaging Samples under Stress.- Use of Tilt and Rotation during Imaging.- Use of STEM detector in SEM.- Use of EBSD in SEM.- SEM Operation.- Specimen Insertion.- Image Acquisition.- Microscope Alignment.- Image Quality.- High Resolution Imaging.- Maintenance of the SEM.- Microchemical Analysis with the SEM.- Working of the EDS Detector.- Characteristics of the EDS Detector.- Qualitative EDS Analysis.- Quantitative EDS Analysis.- Atomic Number (Z) Effect.- X-ray Absorption (A) Effect.- X-ray Fluorescence (F) Effect.- ZAF Corrections.- Standardless Analysis.- Trace Element Analysis.- Sample Preparation.- Metals, Alloys, Ceramics and Semiconductors.- Polymers.- Geological Samples.- Biological Samples.- Semiconductors.- Use of Focused Ion Beam.
• Publisher Details: Cham, Switzerland : Springer
• Publication Date: 2018
• Extent: 1 online resource, illustrations
• Subjects: 502.825; Materials science; Scanning electron microscopy; SCIENCE / Electron Microscopes & Microscopy; Science -- Spectroscopy & Spectrum Analysis; Technology & Engineering -- Nanotechnology & MEMS; Science -- Life Sciences -- General; Spectrum analysis, spectrochemistry, mass spectrometry; Precision instruments manufacture; Biology, life sciences; Nanotechnology; Surfaces (Physics); Engineering; Microscopy; Nanotechnology; Technology & Engineering -- Material Science; Testing of materials; Electronic books
• Languages: English
• ISBNs: 9783319984827; 3319984829
• Related ISBNs: 9783319984810; 3319984810
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (EBSCO, viewed October 31, 2018).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.