Tantalum and niobium-based capacitors : science, technology, and applications /: science, technology, and applications. ([2018])

• Record Type: Book
• Further Information: Note: Yuri Freeman.
• Other Names: Freeman, Yuri
• Contents: Introduction -- Chap1: Major Degradation Mechanisms -- Chap2: Basic Technology -- Chap3: Applications -- Conclusion.
• Publisher Details: Cham : Springer
• Publication Date: 2018
• Extent: 1 online resource (133 pages)
• Subjects: 620; Engineering; Capacitors; Capacitors -- Materials; TECHNOLOGY & ENGINEERING -- Mechanical; Capacitors; Technology & Engineering -- Electronics -- Circuits -- General; Technology & Engineering -- Electronics -- General; Circuits & components; Electronics engineering; Systems engineering; Electronics; Electronic books
• Languages: English
• ISBNs: 9783319678702; 3319678701
• Related ISBNs: 9783319678696; 3319678698
• Notes: Note: Includes bibliographical references and index.; Note: Print version record.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.