Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /: an introduction to TEM, SEM, and AEM. (2016)

• Record Type: Book
• Further Information: Note: Ray F. Egerton.
• Authors: Egerton, R. F
• Contents: An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations.
• Publisher Details: Switzerland : Springer
• Publication Date: 2016
• Extent: 1 online resource (xi, 196 pages), illustrations
• Subjects: 502.8/25; Materials science; Electron microscopy; Electron microscopy; Science -- Spectroscopy & Spectrum Analysis; Science -- Life Sciences -- General; Technology & Engineering -- Nanotechnology & MEMS; Spectrum analysis, spectrochemistry, mass spectrometry; Biology, life sciences; Nanotechnology; Surfaces (Physics); Microscopy; Nanotechnology; Technology & Engineering -- Material Science; Testing of materials; Electronic books
• Languages: English
• ISBNs: 9783319398778; 3319398776; 3319398768; 9783319398761
• Related ISBNs: 9783319398761
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (SpringerLink, viewed July 8, 2016).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.