Ion-irradiation-induced damage in nuclear materials : case study of a-SiO₂ and MgO /: case study of a-SiO₂ and MgO. (2018)
- Record Type:
- Book
- Title:
- Ion-irradiation-induced damage in nuclear materials : case study of a-SiO₂ and MgO /: case study of a-SiO₂ and MgO. (2018)
- Main Title:
- Ion-irradiation-induced damage in nuclear materials : case study of a-SiO₂ and MgO
- Further Information:
- Note: Diana Bachiller Perea.
- Authors:
- Perea, Diana Bachiller
- Contents:
- Intro; Supervisors' Foreword; Abstract; Scientific Output; Publications; Contributions to Conferences; Contents; Acronyms; 1 Introduction; 1.1 Motivation of the Thesis; 1.2 Current State of Knowledge and Issues Addressed in this Work; 1.2.1 Amorphous Silica; 1.2.2 Magnesium Oxide; 1.3 Description of the Chapters; References; Part I Materials and Methods; 2 Studied Materials: a-SiO2 and MgO; 2.1 Amorphous Silica (a-SiO2); 2.1.1 Structure of Amorphous SiO2; 2.1.2 Point Defects in Amorphous SiO2; 2.1.3 Calculation of the OH Concentration in Silica from Infrared Spectroscopic Measurements 2.2 Magnesium Oxide (MgO)2.2.1 Point Defects in MgO; 2.2.2 Impurities in the MgO Samples; References; 3 Ion-Solid Interactions and Ion Beam Modification of Materials; 3.1 Ion-Solid Interactions; 3.1.1 Stopping Power and Ion Range; 3.1.2 Calculations with SRIM; 3.2 Ion Beam Modification of Materials and Ion Beam Analysis Techniques; 3.2.1 Different Processes of Modification of Materials; 3.2.2 Ion Beam Analysis Techniques; References; 4 Experimental Facilities; 4.1 Centro de Micro-Análisis de Materiales (CMAM); 4.2 Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM) 4.3 The Ion Beam Materials Laboratory (IBML)References; 5 Experimental Characterization Techniques; 5.1 Ion Beam Induced Luminescence (IBIL); 5.2 Rutherford Backscattering Spectrometry (RBS); 5.2.1 Description of the RBS Technique; 5.2.2 RBS in Channeling Configuration (RBS/C); 5.3 X-Ray Diffraction (XRD); 5.3.1Intro; Supervisors' Foreword; Abstract; Scientific Output; Publications; Contributions to Conferences; Contents; Acronyms; 1 Introduction; 1.1 Motivation of the Thesis; 1.2 Current State of Knowledge and Issues Addressed in this Work; 1.2.1 Amorphous Silica; 1.2.2 Magnesium Oxide; 1.3 Description of the Chapters; References; Part I Materials and Methods; 2 Studied Materials: a-SiO2 and MgO; 2.1 Amorphous Silica (a-SiO2); 2.1.1 Structure of Amorphous SiO2; 2.1.2 Point Defects in Amorphous SiO2; 2.1.3 Calculation of the OH Concentration in Silica from Infrared Spectroscopic Measurements 2.2 Magnesium Oxide (MgO)2.2.1 Point Defects in MgO; 2.2.2 Impurities in the MgO Samples; References; 3 Ion-Solid Interactions and Ion Beam Modification of Materials; 3.1 Ion-Solid Interactions; 3.1.1 Stopping Power and Ion Range; 3.1.2 Calculations with SRIM; 3.2 Ion Beam Modification of Materials and Ion Beam Analysis Techniques; 3.2.1 Different Processes of Modification of Materials; 3.2.2 Ion Beam Analysis Techniques; References; 4 Experimental Facilities; 4.1 Centro de Micro-Análisis de Materiales (CMAM); 4.2 Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM) 4.3 The Ion Beam Materials Laboratory (IBML)References; 5 Experimental Characterization Techniques; 5.1 Ion Beam Induced Luminescence (IBIL); 5.2 Rutherford Backscattering Spectrometry (RBS); 5.2.1 Description of the RBS Technique; 5.2.2 RBS in Channeling Configuration (RBS/C); 5.3 X-Ray Diffraction (XRD); 5.3.1 Crystalline Structures; 5.3.2 Diffraction Phenomenon; 5.3.3 Experimental Setup; References; Part II Ion Beam Induced Luminescence in Amorphous Silica; 6 General Features of the Ion Beam Induced Luminescence in Amorphous Silica 6.1 General Features of the Ionoluminescence Signal in Silica at Room Temperature6.2 Ionoluminescence in Silica at Low Temperature; 6.3 Contribution of the Nuclear Stopping Power to the Ionoluminescence Signal; References; 7 Ionoluminescence in Silica: Role of the Silanol Group Content and the Ion Stopping Power; 7.1 IL Spectra; 7.2 Kinetic Behavior for the IL; 7.3 Dependence of the Maximum Intensity with the Stopping Power; 7.4 Discussion; 7.4.1 Role of the OH Content; 7.4.2 Role of the Electronic Stopping Power; References 8 Exciton Mechanisms and Modeling of the Ionoluminescence in Silica8.1 Kinetic Behavior for the IL: Correlation with Structural (Macroscopic) Damage; 8.2 Physical Modeling of STE Dynamics and IL Mechanisms; 8.3 Physical Discussion of the Experimental Results: Role of Network Straining; 8.4 Mathematical Formulation of the IL Emission Kinetics: Damage Cross-Sections; References; Part III Ion-Irradiation Damage in MgO; 9 MgO Under Ion Irradiation at High Temperatures; 9.1 Full Damage Accumulation Process in MgO Irradiated with MeV Au Ions …; 9.1.1 Disorder Depth Profiles … (more)
- Publisher Details:
- Cham, Switzerland : Springer
- Publication Date:
- 2018
- Extent:
- 1 online resource
- Subjects:
- 621.48/332
Materials science
Nuclear reactors -- Materials
Nuclear reactors -- Materials -- Testing
TECHNOLOGY & ENGINEERING / Mechanical
Technology & Engineering -- Power Resources -- General
Science -- Nuclear Physics
Technology & Engineering -- Power Resources -- Nuclear
Energy technology & engineering
Nuclear physics
Nuclear power & engineering
Surfaces (Physics)
Electric engineering
Nuclear fusion
Nuclear engineering
Technology & Engineering -- Material Science
Testing of materials
Electronic books - Languages:
- English
- ISBNs:
- 9783030004071
3030004074 - Related ISBNs:
- 9783030004064
- Notes:
- Note: Includes bibliographical references.
Note: Online resource; title from PDF title page (SpringerLink, viewed October 3, 2018). - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
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- British Library HMNTS - ELD.DS.333865
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