Progress in nanoscale characterization and manipulation. (2018)

• Record Type: Book
• Further Information: Note: Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai, editors.
• Editors: Wang, Rongming; Wang, Chen; Zhang, Hongzhou; Tao, Jing; Bai, Xuedong
• Contents: Electron/Ion Optics.-Scanning Electron Microscopy.-Transmission Electron Microscopy.-Scanning Transmission Electron Microscopy (STEM).-Spectroscopy.-Aberration Corrected Transmission Electron Microscopy and Its Applications.-In situ TEM: Theory and Applications.-Helium Ion Microscopy.
• Publisher Details: Singapore : Springer
• Publication Date: 2018
• Extent: 1 online resource (vii, 508 pages), illustrations (some color)
• Subjects: 502.8/25; Physics; Electron microscopy; Nanostructured materials -- Optical properties; Technology & Engineering -- Material Science; Science -- Spectroscopy & Spectrum Analysis; Testing of materials; Spectrum analysis, spectrochemistry, mass spectrometry; Surfaces (Physics); Science -- Nanostructures; Nanotechnology; Electronic books
• Languages: English
• ISBNs: 9789811304545; 9811304548
• Related ISBNs: 9789811304538; 981130453X
• Notes: Note: Online resource; title from PDF title page (SpringerLink, viewed September 5, 2018).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.