Nanometer CMOS ICs : from basics to ASICs /: from basics to ASICs. (2017)

• Record Type: Book
• Further Information: Note: Harry J. M. Veendrick.
• Authors: Veendrick, H. J. M (Harry J. M.)
• Contents: Basic Principles -- Geometrical-, Physical- and Field-Scaling Impact on MOS Transistor Behavior -- Manufacture of MOS Devices -- CMOS Circuits -- Special Circuits, Devices and Technologies -- Memories -- Very Large Scale Integration (VLSI) and ASICs -- Low Power, a Hot Topic in IC Design -- Robustness of Nanometer CMOS Designs: Signal Integrity, Variability and Reliability -- Testing, Yield, Packaging, Debug and Failure Analysis -- Effects of Scaling on MOS IC Design and Consequences for the Roadmap.
• Publisher Details: Cham : Springer
• Publication Date: 2017
• Extent: 1 online resource (xxxvii, 595 pages), illustrations (some color)
• Subjects: 621.3815/2; Engineering; Metal oxide semiconductors, Complementary; Application-specific integrated circuits; Application-specific integrated circuits; Metal oxide semiconductors, Complementary; Technology & Engineering -- Electronics -- Circuits -- General; Technology & Engineering -- Electronics -- General; Circuits & components; Electronics engineering; Systems engineering; Electronics; Electronic books
• Languages: English
• ISBNs: 9783319475974; 3319475975
• Related ISBNs: 9783319475950; 3319475959
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from pdf information screen (Springer, viewed May 5, 2017).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.