Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 /: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000. (2000)
- Record Type:
- Book
- Title:
- Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 /: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000. (2000)
- Main Title:
- Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000
- Further Information:
- Note: Edited by David B Williams and Ryuichi Shimizu ; edited by David B Williams and Ryuichi Shimizu.
- Other Names:
- Williams, David B (David Bernard), 1949-
Shimizu, R (Ryūichi), 1937-
International Union of Microbeam Analysis Societies., Conference, (2nd) 2000 (Kailua Kona, Hawaii) - Contents:
- Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.
- Publisher Details:
- Place of publication not identified : CRC Press
- Publication Date:
- 2000
- Extent:
- 1 online resource (284 pages)
- Subjects:
- 545/.842
Electron probe microanalysis -- Congresses
Microprobe analysis -- Congresses
Micrurgy -- Congresses
Spectrum analysis -- Congresses
Electron probe microanalysis
Microprobe analysis
Micrurgy
Spectrum analysis
Conference papers and proceedings
Congresses - Languages:
- English
- ISBNs:
- 9781482289428
1482289423 - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
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- British Library HMNTS - ELD.DS.315178
- Ingest File:
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