Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992 /: proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. ([2017?])
- Record Type:
- Book
- Title:
- Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992 /: proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. ([2017?])
- Main Title:
- Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992
- Further Information:
- Note: Edited by A.G. Fitzgerald, B.E. Storey, D. Fabian.
- Editors:
- Fitzgerald, A. G
Storey, B. E
Fabian, Derek J - Other Names:
- Scottish Universities Summer School in Physics, 40th
- Contents:
- Quantification in AES and XPS / M.P. Seah -- Surface Analytical Imaging / M. Prutton -- Electronic Structure and Electron Spectroscopy / G. Van der Laan -- Auger Electron Spectroscopy in the STEM / P. Kruit -- Electron Energy-Loss Spectroscopy -- EELS / R.F. Egerton -- Light Element Microanalysis and Imaging / D.B. Williams -- A Comparison of Quantification Methods and Analytical Techniques / A.G. Fitzgerald -- Data Analysis and Processing / P. Trebbia -- Microscopy and Microanalysis of Insulating Materials / J. Cuzaux -- Electron Specimen Interactions / D.C. Joy -- Electron Probe X-ray Microanalysis / P. Van Espen -- Energy Dispersive X-Ray Analysis (EDX) in the TEM/STEM / J.M. Titchmarsh -- Analysis and Imaging by Proton-Induced X-Ray Emission (PIXE) / J.L. Campbell -- Ion-Beam Analytical Techniques -- Rutherford Backscattering, Elastic Recoil and Nuclear Reaction Analysis / E.A. Maydell -- Quantitative Analysis of Solids by SIMS and SNMS / K. Wittmaack -- Static SIMS / D. Briggs. Applications of Surface, Interface and Thin Film Analysis in an Industrial Research Laboratory / H.W. Werner -- Ion-Induced Auger Electron Emission From Solids / D.J. Fabian -- Resonance Ionisation Mass Spectrometry (RIMS) / K.W. Ledingham.
- Publisher Details:
- Abingdon : Routledge
- Publication Date:
- 2017
- Copyright Date:
- 1993
- Extent:
- 1 online resource, illustrations
- Subjects:
- 502.8/25
Electron microscopy -- Congresses
Electron probe microanalysis -- Congresses
SCIENCE / General
Conference papers and proceedings
Electronic books
Electronic books - Languages:
- English
- ISBNs:
- 9781351420525
1351420526 - Related ISBNs:
- 9780750302562
0750302569 - Notes:
- Note: Includes bibliographical references and index.
- Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.301473
- Ingest File:
- 01_222.xml