Electron Microscopy and Analysis 2003 : Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003 /: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003. (2004)

• Record Type: Book
• Further Information: Note: Editors, S McVitie, D McComb.
• Editors: McVitie, S; McComb, D
• Contents: Cover; Half Title; Title Page; Copyright Page; Preface; Contents; Section 1: Plenary Lectures; Imaging and spectroscopy of individual atoms, clusters and interfaces in electronic materials and devices; Tomographic Diffractive Imaging for Nanoscience and Biology; Section 2: Functional Materials and Biomaterials; Electron Energy Loss Spectroscopy of Extended Defects; TEM assessment of As-doped GaN epitaxial layers grown on sapphire; 3D analysis of semiconductor structures using HAADF STEM tomography; The Non-Uniform Composition Profile in Ge(Si)/Si(OOl) Quantum Dots The structure of uncapped, buried and multiple stacked Ge/Si quantum dotsImage interpretation in Lorentz transmission electron; Amorphous ferromagnetic layers for magnetic tunnel; Computer simulation and experimental observation of stripe phases in La1-xCaxMn03; Structural and compositional characterization of LiF thin films on Si; Selected techniques for examining the electrical, optical and spatial properties of extended defects in semiconductors; A room temperature cathodoluminescence study of dislocations in silicon Studies of variations in insertion cations in intergrowth tungsten bronzes (ITBs)Study of phase transition in filled-skutterudite PrRt4P12 at low temperature by electron diffraction; Understanding gate oxide materials: ELNES of Hf; Analytical electron microscope investigation of iron within human liver biopsies; Scanning electron microscopy of biomaterials; Electron Microscopy of Si-based Photonic Materials; TEM analysis and fabrication of magnetic nanoparticles; TEM studies of dislocation-based silicon light emitting devices Composition modulation and growth-associated defects in GalnNAs/GaAs multi quantum wellsMicrostructural study of multilayer YBCO on a curved Ni surface; The effects of oxygen on the electronic structure of MgB2; Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN; ELNES of titanate perovskites -- a probe of structure and bonding; Deformation in GaAs under nanoindentation; Characterisation of C supported Pt nano-particles using HREM; Indium fluctuations analysis inside loGaN quantum wells by scanning transmission Cathodoluminescence spectral mapping of selectively grown III-nitride structuresStructural modelling ofnano-amorphous Si-0-N films in silicon nitride ceramics; High-resolution scanning electron microscopy of dopants in p-i-n junctions with quantum wells; SEM / EDXS and polymers -- A sociable couple?; Nanostructural studies of biomineralised composites; RHEED characterisation of the near surface microstructure of Ti-0 based biocompatible coatings; Section 3: New Instrumentation; Towards sub-0.5 angstrom beams through aberration corrected STEM
• Publisher Details: Boca Raton, FL : CRC Press
• Publication Date: 2004
• Extent: 1 online resource
• Subjects: 502.825; Microscopy; Chromatographic analysis; Optoelectronics; Chromatographic analysis; Microscopy; Optoelectronics; Electronic books
• Languages: English
• ISBNs: 9781482269130; 1482269139
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.