Advances in imaging and electron physics. Volume 205 ([2018])
- Record Type:
- Book
- Title:
- Advances in imaging and electron physics. Volume 205 ([2018])
- Main Title:
- Advances in imaging and electron physics.
- Further Information:
- Note: Edited by Peter W. Hawkes.
- Editors:
- Hawkes, P. W
- Contents:
- The Early Electron Microscopes, a Critical Study John van Gorkom, Dirk van Delft and Ton van Helvoort Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools Erich Plies
- Issue Display:
- Volume 205
- Volume:
- 205
- Issue Sort Value:
- 0000-0205-0000-0000
- Publisher Details:
- London : Academic Press
- Publication Date:
- 2018
- Copyright Date:
- 2018
- Extent:
- 1 online resource, illustrations
- Subjects:
- 537.5
Electrons
Image processing
Optoelectronic devices
Optical data processing
SCIENCE / Physics / Electricity
SCIENCE / Physics / Electromagnetism
Electronic books - Languages:
- English
- ISBNs:
- 9780128155431
0128155434 - Related ISBNs:
- 9780128152171
0128152176 - Notes:
- Note: Includes bibliographical references and index.
Note: Online resource; title from PDF title page (EBSCO, viewed March 26, 2018). - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.273169
- Ingest File:
- 01_177.xml