Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /: SPM applications for nanometrology. (2018)

• Record Type: Book
• Further Information: Note: Edited by Petr Klapetek.
• Authors: Klapetek, Petr
• Editors: Klapetek, Petr
• Contents: 1. Motivation; 2. Instrumentation Principles; 3. Data Models; 4. Basic Data Processing; 5. Dimensional Measurements; 6. Force and Mechanical Properties; 7. Friction and Lateral Forces; 8. Electrostatic Fields; 9. Magnetic Fields; 10. Local Current Measurements; 11. Thermal Measurement; 12. Optical Measurements; 13. Sample Data Files; 14. Numerical Modeling Techniques
• Edition: Second edition
• Publisher Details: Amsterdam : Elsevier
• Publication Date: 2018
• Extent: 1 online resource
• Subjects: 502.82; Scanning probe microscopy; Scanning probe microscopy -- Data processing; Qualitative research -- Data processing
• Languages: English
• ISBNs: 9780128133484
• Related ISBNs: 9780128133477
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.