Advances in imaging and electron physics. Volume 188 (2015)
- Record Type:
- Book
- Title:
- Advances in imaging and electron physics. Volume 188 (2015)
- Main Title:
- Advances in imaging and electron physics.
- Further Information:
- Note: Edited by Peter W. Hawkes, CEMES-CNRS, Toulouse, France.
- Editors:
- Hawkes, P. W
- Contents:
- Front Cover; Advances in Imaging and Electron Physics; Copyright; Contents; Preface; Future Contributions; Contributors; Chapter 1: Pattern Generators for Reflective Electron-Beam Lithography (REBL); 1. Introduction; 2. REBL and DPG Basics; 3. Lenslet Analysis; 4. REBL Patterning Strategy and Column Optics; 5. Charge Draining; 6. DPG2 Design and Realization; 7. Example of Lithographic Results; 8. Innovations in DPG3; 9. Summary; Acknowledgments; References; Chapter 2: Recent Developments in Time-of-Flight Mass Spectrometry; 1. Introduction; 1.1. The Concept of a Time-of-Flight Analyzer. 1.2. The Wiley-McLaren Ion Source1.3. The Reflectron; 2. Recent Development in Time-of-Flight Mass Spectrometry; 2.1. Progress Regarding Instrumentation; 2.1.1. Imaging Time-of-Flight Mass Spectrometry; 2.1.2. Multiturn and Multipass Time-of-Flight Mass Spectrometry; 2.1.3. Ion Mobility Spectrometry; 2.1.4. Single Photon Ionization; 2.2. Scientific Applications; 2.2.1. MALDI; 2.2.2. SIMS; 2.2.3. MATI; 2.2.4. Tandem Mass Spectrometry; 3. Outlook; References; Chapter 3: A Special Voice Transform, Analytic Wavelets, and Zernike Functions; 1. Introduction; 1.1. Affine Wavelets and Multiresolution. 1.2. The Voice Transform2. The Hyperbolic Wavelet Transform; 2.1. The Blaschke Group; 2.2. Hardy Spaces; 2.3. The Continuous Voice Transform on H2(T); 3. Multiresolution in the Hardy Space of the Unit Disk; 3.1. Construction of Multiresolution in H2(T); 3.2. The Properties of the Projection OperatorFront Cover; Advances in Imaging and Electron Physics; Copyright; Contents; Preface; Future Contributions; Contributors; Chapter 1: Pattern Generators for Reflective Electron-Beam Lithography (REBL); 1. Introduction; 2. REBL and DPG Basics; 3. Lenslet Analysis; 4. REBL Patterning Strategy and Column Optics; 5. Charge Draining; 6. DPG2 Design and Realization; 7. Example of Lithographic Results; 8. Innovations in DPG3; 9. Summary; Acknowledgments; References; Chapter 2: Recent Developments in Time-of-Flight Mass Spectrometry; 1. Introduction; 1.1. The Concept of a Time-of-Flight Analyzer. 1.2. The Wiley-McLaren Ion Source1.3. The Reflectron; 2. Recent Development in Time-of-Flight Mass Spectrometry; 2.1. Progress Regarding Instrumentation; 2.1.1. Imaging Time-of-Flight Mass Spectrometry; 2.1.2. Multiturn and Multipass Time-of-Flight Mass Spectrometry; 2.1.3. Ion Mobility Spectrometry; 2.1.4. Single Photon Ionization; 2.2. Scientific Applications; 2.2.1. MALDI; 2.2.2. SIMS; 2.2.3. MATI; 2.2.4. Tandem Mass Spectrometry; 3. Outlook; References; Chapter 3: A Special Voice Transform, Analytic Wavelets, and Zernike Functions; 1. Introduction; 1.1. Affine Wavelets and Multiresolution. 1.2. The Voice Transform2. The Hyperbolic Wavelet Transform; 2.1. The Blaschke Group; 2.2. Hardy Spaces; 2.3. The Continuous Voice Transform on H2(T); 3. Multiresolution in the Hardy Space of the Unit Disk; 3.1. Construction of Multiresolution in H2(T); 3.2. The Properties of the Projection Operator Corresponding to the nth Resolution Level; 3.3. Reconstruction Algorithm Using the Wavelet Base; 3.4. Discrete Orthogonality of the Hyperbolic Wavelet Basis; 4. Multiresolution in the Hardy Space of the Upper Half-plane; 4.1. Transition to the Upper Half-plane, Motivation. 4.2. A Special Discrete Subset in the Upper Half-plane4.3. Multiresolution in the Hardy Space of the Upper Half-plane; 4.4. The Projection Operator Corresponding to the nth Resolution Level; 4.5. Reconstruction Algorithm; 5. Connection Between the Voice Transform, Zernike Polynomials and Applications; 5.1. The Zernike Polynomials; 5.2. The Matrix Elements of the Representation of the Blaschke Group; 5.3. Discrete Orthogonality of Complex Zernike Functions; 5.4. Zernike Moments, Applications; Acknowledgments; References. Chapter 4: The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and Imaging1. Introduction; 2. The nD case; 3. The 1D Case; 4. The 2D Case; 5. The 3D Case: The Spherically Symmetrical Fourier Transform; 5.1. Separation of the Green function into Near- and Far-Field parts; 5.2. The Rayleigh-Sommerfeld Diffraction Integral; 5.3. The Field of a Scalar Source or Dipole; 6. The 4D Case; 7. The Projection-Slice Theorem; 8. Applications in Optical Diffraction and Imaging; 9. Conclusions; References; Contents of Volumes 151-187; Index; Color Plate. … (more)
- Issue Display:
- Volume 188
- Volume:
- 188
- Issue Sort Value:
- 0000-0188-0000-0000
- Publisher Details:
- Amsterdam [Netherlands] : Academic Press
- Publication Date:
- 2015
- Copyright Date:
- 2015
- Extent:
- 1 online resource (223 pages, 9 unnumbered pages of plates), illustrations (some color)
- Subjects:
- 581.35
Electronics
Image processing
Electrons
Electronics
Electrons
Image processing
Electronic books - Languages:
- English
- ISBNs:
- 9780128025208
0128025204 - Related ISBNs:
- 9780128022542
- Notes:
- Note: Includes bibliographical references at the end of each chapters and index.
Note: Online resource; title from PDF title page (ebrary, viewed May 6, 2015). - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.217548
- Ingest File:
- 02_263.xml