Industrial applications of X-ray diffraction. ([1999])

• Record Type: Book
• Further Information: Note: Edited by Frank H. Chung, Sherwin-Williams Company, Chicago, Illinois, Deane K. Smith, the Pennsylvania State University, University Park, Pennsylvania.
• Editors: Chung, Frank H, 1930-; Smith, Deane K (Deane Kingsley)
• Contents: Front Cover; Preface; Contents; Contributors; I. Introduction; 1. The Principles of Diffraction Analysis; 2. The Practice of Diffraction Analysis; 3. Progress and Potential of X-Ray Diffraction; II. Industrial Applications; 4. Semiconductors: Integrated Circuit Manufacture; 5. Superconductors: Structures and Applications; 6. Aerospace: The Aircraft Gas Turbine Industry; 7. Selected Applications of X-Ray Diffraction in the Automotive Industry; 8. Petroleum Exploration and Production; 9. Petroleum and Petrochemicals; 10. Petroleum Catalysts; 11. Petrochemicals: Vitality of Catalysts Research. 12. Hydrometallurgy13. X-Ray Fractography; 14. Mining: Exploration and Process Control; 15. Mining: Mineral Ores and Products; 16. Cement: Quantitative Phase Analysis of Portland Cement Clinker; 17. Silica; 18. Glass-Ceramics; 19. Polymer Industry; 20. Paint and Pigment Industry; 21. Pharmaceuticals: Development and Formulation; 22. Pharmaceuticals: Design and Development of Drug Delivery Systems; 23. Energy: By-Products of Coal Combustion in Power Plants; 24. Lighting: Design and Development of Luminescent Materials; 25. Photography: Image Capture and Image Storage Materials. 26. Detergents and Cleaners: Phase Analysis of Sodium Phosphates27. Museum: Art and Archaeology; 28. Forensic Science: Every Contact Leaves a Trace; 29. U.S. Customs Laboratories; 30. Commercial Service Laboratory; III. Specialty Techniques; 31. Synchrotron Usage by Industry; 32. Electron Microscopy in Industry; 33. Line Profiles and Sample Microstructure; 34. Thin Films and Multilayers; 35. Residual Stress and Stress Gradients; 36. Residual Stress Development and Texture Formation During Rolling Contact Loading; 37. Warren-Aver bach Applications. 38. Microbeam Crystallographic and Elemental Analysis39. High-Temperature and Nonambient X-Ray Diffraction; 40. NIST Standard Reference Materials for Characterization of Instrument Performance; 41. Grain Orientation and Texture; 42. Structure Analysis from Powder Data.
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 1999
• Copyright Date: 1999
• Extent: 1 online resource (1012 pages), illustrations
• Subjects: 621.36/73; Radiography, Industrial; X-rays -- Diffraction; Radiography, Industrial; X-rays -- Diffraction; Radiography, Industrial; X-rays -- Diffraction; Electronic books
• Languages: English
• ISBNs: 9781482276114; 1482276119
• Related ISBNs: 9780824719920
• Notes: Note: Includes bibliographical references.; Note: Online resource; title from PDF title page (ebrary, viewed May 31, 2014).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.