Materials characterization techniques. (2008)
- Record Type:
- Book
- Title:
- Materials characterization techniques. (2008)
- Main Title:
- Materials characterization techniques
- Further Information:
- Note: Sam Zhang, Lin Li, Ashok Kumar.
- Other Names:
- Zhang, Sam
Li, L (Lin), 1959-
Kumar, Ashok, 1962- - Contents:
- Preface Introduction Contact Angle in Surface Analysis Measuring Contact Angle Determining Surface Energy of a Homogeneous Solid Surface Work Examples X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy Atomic Model and Electron Configuration Principles of XPS and AES Instrumentation Routine Limits of XPS XPS Applications and Case Studies AES Applications Scanning Tunneling Microscopy and Atomic Force Microscopy Working Principle Instrumentation Modes of Operation Differences between STM and AFM Applications X-ray Diffraction X-ray Characteristics and Generation Lattice Planes and Bragg’s Law Powder Diffraction Thin Film Diffraction Texture Measurement Grazing Angle X-ray Diffraction Transmission Electron Microscopy Basics of Transmission Electron Microscopes Reciprocal Lattice Specimen Preparation Bright-Field and Dark-Field Images Electron Energy Loss Spectroscopy Scanning Electron Microscopy Introduction to Scanning Electron Microscopes Electron Beam–Specimen Interaction SEM Operating Parameters Applications Chromatographic Methods General Principles of Chromatography Ion Exchange Chromatography Gel Permeation Chromatography Gel Electrophoresis Chromatography High-Performance Liquid Chromatography Gas Chromatography Quantitative Analysis Methods Infrared Spectroscopy and UV/Vis Spectroscopy Infrared Radiation Spectroscopy Ultraviolet/Visible Spectroscopy Macro and Micro Thermal Analyses Macro and Micro Differential Scanning Calorimetry Isothermal TitrationPreface Introduction Contact Angle in Surface Analysis Measuring Contact Angle Determining Surface Energy of a Homogeneous Solid Surface Work Examples X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy Atomic Model and Electron Configuration Principles of XPS and AES Instrumentation Routine Limits of XPS XPS Applications and Case Studies AES Applications Scanning Tunneling Microscopy and Atomic Force Microscopy Working Principle Instrumentation Modes of Operation Differences between STM and AFM Applications X-ray Diffraction X-ray Characteristics and Generation Lattice Planes and Bragg’s Law Powder Diffraction Thin Film Diffraction Texture Measurement Grazing Angle X-ray Diffraction Transmission Electron Microscopy Basics of Transmission Electron Microscopes Reciprocal Lattice Specimen Preparation Bright-Field and Dark-Field Images Electron Energy Loss Spectroscopy Scanning Electron Microscopy Introduction to Scanning Electron Microscopes Electron Beam–Specimen Interaction SEM Operating Parameters Applications Chromatographic Methods General Principles of Chromatography Ion Exchange Chromatography Gel Permeation Chromatography Gel Electrophoresis Chromatography High-Performance Liquid Chromatography Gas Chromatography Quantitative Analysis Methods Infrared Spectroscopy and UV/Vis Spectroscopy Infrared Radiation Spectroscopy Ultraviolet/Visible Spectroscopy Macro and Micro Thermal Analyses Macro and Micro Differential Scanning Calorimetry Isothermal Titration Calorimetry Thermogravimetric Analysis Laser Confocal Fluorescence Microscopy Fluorescence and Fluorescent Dyes Fluorescence Microscopy Laser Confocal Fluorescence Microscopy Applications of LCFM Index … (more)
- Publisher Details:
- Place of publication not identified : CRC Press
- Publication Date:
- 2008
- Extent:
- 1 online resource, illustrations
- Subjects:
- 620.110287
Materials -- Testing - Languages:
- English
- ISBNs:
- 9781420042955
1420042955 - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.150098
- Ingest File:
- 02_013.xml