Testing complex and embedded systems. (©2011)

• Record Type: Book
• Further Information: Note: Kim H. Pries, Jon M. Quigley.
• Other Names: Pries, Kim H, 1955-; Quigley, Jon M
• Contents: 1. Does your testing look like this? -- 2. Benefits of improved testing -- 3. Overview -- 4. Basic principles -- 5. The question -- 6. Contradictory perspectives of testing -- 7. The use of noise -- 8. How to perform 'bad' tests -- 9. Documenting the testing -- 10. Test administration -- 11. Advanced concepts -- 12. Software test documentation -- 13. Configuration management -- 14. Software testing -- 15. Systems testing -- 16. Simulation and emulation -- 17. Span of tests -- 18. Exit criteria.
• Publisher Details: Boca Raton, FL : CRC Press
• Publication Date: 2011
• Copyright Date: 2011
• Extent: 1 online resource (xxxi, 287 pages), illustrations
• Subjects: 004.16; Embedded computer systems -- Testing; Electrical engineering; Computer science; Engineering; COMPUTERS -- Software Development & Engineering -- General; TECHNOLOGY & ENGINEERING -- Electronics -- General; TECHNOLOGY & ENGINEERING -- Engineering (General); COMPUTERS -- Hardware -- Personal Computers -- General; COMPUTERS -- Hardware -- Handheld Devices; COMPUTERS -- Microprocessors; Embedded computer systems -- Testing; Electronic books
• Languages: English
• ISBNs: 9781439821411; 1439821410
• Related ISBNs: 9781439821404; 1439821402
• Notes: Note: Includes bibliographical references and index.; Note: Print version record.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.