High performance CMOS range imaging : device technology and systems considerations /: device technology and systems considerations. ([2016])
- Record Type:
- Book
- Title:
- High performance CMOS range imaging : device technology and systems considerations /: device technology and systems considerations. ([2016])
- Main Title:
- High performance CMOS range imaging : device technology and systems considerations
- Further Information:
- Note: Andreas Süss.
- Authors:
- Süss, Andreas
- Contents:
- 1 Introduction 2 State of the art range imaging; 2.1 Triangulation; 2.2 Interferometry; 2.3 Time-of-flight; 2.3.1 Direct time-of-flight; 2.3.2 Continuous wave method; 2.3.3 Pulsed wave method; 2.4 Comparison of optical range imaging methods 3 Temporal noise; 3.1 Introduction to noise analysis; 3.1.1 Basic probabilistic concepts for the analysis of uncertainties; 3.1.2 Stochastic processes; 3.1.3 Propagation of noise in linear time-invariant circuits; 3.2 Noise analysis in non-linear and time-variant systems; 3.2.1 Transformation of probability density functions; 3.2.2 Employing z-transform for noise analysis; 3.2.3 LPTV methods; 3.2.4 Propagation of noise in non-linear time-variant systems; 3.2.5 Noise in the time domain; 3.2.6 A sequential method using a switching time-frequency domain; 3.3 Fundamental noise processes in electronic devices; 3.3.1 Thermal noise; 3.3.2 Shot noise and photon noise; 3.3.3 Remarks on thermal noise; 3.3.4 Generation-recombination noise; 3.3.5 Random telegraph signal noise – burst noise; 3.3.6 Flicker noise; 3.4 Noise processes under time-varying bias; 3.5 Impedance field method 4 Noise performance of devices available in the 0.35μm CMOS process; 4.1 Transistor noise basics; 4.1.1 Bipolar transistor noise model; 4.1.2 Field-effect transistor noise modeling; 4.2 Noise performance of standard MOS Field-Effect Transistors; 4.3 Noise performance of available bipolar devices 5 Noise in active pixel sensors; 5.1 Photodetector principle; 5.21 Introduction 2 State of the art range imaging; 2.1 Triangulation; 2.2 Interferometry; 2.3 Time-of-flight; 2.3.1 Direct time-of-flight; 2.3.2 Continuous wave method; 2.3.3 Pulsed wave method; 2.4 Comparison of optical range imaging methods 3 Temporal noise; 3.1 Introduction to noise analysis; 3.1.1 Basic probabilistic concepts for the analysis of uncertainties; 3.1.2 Stochastic processes; 3.1.3 Propagation of noise in linear time-invariant circuits; 3.2 Noise analysis in non-linear and time-variant systems; 3.2.1 Transformation of probability density functions; 3.2.2 Employing z-transform for noise analysis; 3.2.3 LPTV methods; 3.2.4 Propagation of noise in non-linear time-variant systems; 3.2.5 Noise in the time domain; 3.2.6 A sequential method using a switching time-frequency domain; 3.3 Fundamental noise processes in electronic devices; 3.3.1 Thermal noise; 3.3.2 Shot noise and photon noise; 3.3.3 Remarks on thermal noise; 3.3.4 Generation-recombination noise; 3.3.5 Random telegraph signal noise – burst noise; 3.3.6 Flicker noise; 3.4 Noise processes under time-varying bias; 3.5 Impedance field method 4 Noise performance of devices available in the 0.35μm CMOS process; 4.1 Transistor noise basics; 4.1.1 Bipolar transistor noise model; 4.1.2 Field-effect transistor noise modeling; 4.2 Noise performance of standard MOS Field-Effect Transistors; 4.3 Noise performance of available bipolar devices 5 Noise in active pixel sensors; 5.1 Photodetector principle; 5.2 Photodetector noise and reduction techniques; 5.2.1 Dark noise; 5.2.2 Photon noise; 5.2.3 Reset noise; 5.2.4 Thermal, flicker and RTS noise; 5.3 Correlated double sampling; 5.4 Novel JFET readout structure for CMOS APS 6 On the design of PM-ToF range imagers; 6.1 Basic concept and constraints; 6.2 Physical limitations due to photon induced shot noise; 6.3 Design objectives and considerations; 6.3.1 Design objectives; 6.3.2 Photodetector selection; 6.3.3 Sensor system architecture; 6.3.4 Fabrication technology; 6.4 Detector design and evaluation; 6.4.1 Readout circuitry; 6.4.2 ToF-LDPD design; 6.4.3 Evaluation of the first generation LDPD based PM-ToF imager; 6.5 Speed considerations for ldpd based TOF image sensors; 6.5.1 Design Considerations for charge transfer speed improvement; 6.5.2 Evaluation of the second generation LDPD based PM-ToF imager; 6.6 Matching considerations; 6.6.1 Alternative ToF-LDPD concept; 6.6.2 Evaluation of the third generation LDPD based PM-ToF imager; 6.7 Impact of finite charge transfer speed and parasitic light sensitivity on PM-TOF; 6.7.1 Concept of the generalized MSI ToF model; 6.7.2 Verification; 6.7.3 Fitting and comparison of the ToF-LDPD designs; 6.7.4 Impact on precision 7 Conclusions; Appendix A Derivation of the autocorrelation formula of shot noise Appendix B Measurement setups B.1 Noise measurement setup B.2 Setup to measure according to the emulated TOF principle Appendix C Photon transfer method Nomenclature Abbreviations Bibliography Index … (more)
- Publisher Details:
- The Hague, The Netherlands : CRC Press, Taylor & Francis Group
- Publication Date:
- 2016
- Copyright Date:
- 2016
- Extent:
- 1 online resource (xxvii, 228 pages), illustrations
- Subjects:
- 621.367
Image processing -- Digital techniques
Metal oxide semiconductors, Complementary
TECHNOLOGY & ENGINEERING / Mechanical
Image processing -- Digital techniques
Metal oxide semiconductors, Complementary
Electronic books - Languages:
- English
- ISBNs:
- 9781315643885
- Related ISBNs:
- 131564388X
9781138029125
1138029122 - Notes:
- Note: Includes bibliographical references (pages 215-228).
Note: Online resource; title from PDF title page (EBSCO, viewed April 6, 2016). - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.138184
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- 01_003.xml