Advances in imaging and electron physics. Volume 199 (2017)

• Record Type: Book
• Further Information: Note: Edited by Peter W. Hawkes.
• Editors: Hawkes, P. W
• Contents: Micro-XRF in Scanning Electron Microscopes M. Haschke and S. Boehm A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps with Regard to Coulomb Interaction I.A. Kopaev, D. Grinfeld, M.A. Monastyrskiy, R.S. Ablizen, S.S. Alimpiev and A.A. Trubitsyn Analytical Review of Direct STEM Imaging Techniques for Thin Samples I. Lazić and E.G.T. Bosch Quantum Nano-Optics in the Electron Microscope L.H.G. Tizei and M. Kociak Component Identification and Interpretation: A Perspective on Tower of Knowledge M. Xu, J. Ren and Z. Wang
• Publisher Details: Amsterdam : Academic Press
• Publication Date: 2017
• Extent: 1 online resource
• Subjects: 621.367; Optoelectronic devices; Optical data processing
• Languages: English
• ISBNs: 9780128121948
• Related ISBNs: 9780128120910
• Notes: Note: Description based on CIP data; item not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.